aaron_do
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Hi all,
I have a differential design which I want to partially characterize using a two-port network analyzer. The setup will include an off-chip balun at the input and output. I am able to calibrate the system up to the input of the baluns, but my calibration does not include the baluns or the wafer probes.
Does anybody know how I can de-embed the baluns+probes from the measurement? I can do a "through" measurement to get the combined S-parameters of both baluns and probes, but I need to know how to de-embed this from my DUT data.
My thinking is that I need to convert the convert the S-parameters into ABCD parameters, and then find the square root of the ABCD matrix in order to get the input and output ABCD parameters. Then I need to assume [ABCD,measured] = [ABCD,fixin][ABCD,DUT][ABCD,fixout] to find [ABCD,DUT] and convert this back to s-parameters. Does this sound correct? What is the easiest software to do this in?
thanks, Aaron
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