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Dec 6th, 2019, 12:28am
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Limits of frequency for device noise generation and BSIM models (Read 23 times)
vivkr
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Limits of frequency for device noise generation and BSIM models
Dec 04th, 2019, 5:32am
 
Hello,

Is there any reason to expect that channel thermal noise might be generated beyond transistor fT?

What is the limit of frequency that one might reasonably expect to see noise contributions at, and are these adequately captured in BSIM models? I seem to be getting noise contributions from channel current well beyond (an order of magnitude) the device fT and I think this doesn't make a lot of sense.

Thanks,
Vivek
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Geoffrey_Coram
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Re: Limits of frequency for device noise generation and BSIM models
Reply #1 - Dec 4th, 2019, 9:33am
 
Thermal noise is usually modeled as white noise, which extends to all frequencies.
Perhaps your question is whether this noise should be filtered out or at least not amplified by the transistor.
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