The Designer's Guide Community Forum
https://designers-guide.org/forum/YaBB.pl Design >> Mixed-Signal Design >> Production Test of 3rd order delta sigma adc/dac i https://designers-guide.org/forum/YaBB.pl?num=1195215954 Message started by babug on Nov 16th, 2007, 4:25am |
Title: Production Test of 3rd order delta sigma adc/dac i Post by babug on Nov 16th, 2007, 4:25am I am trying to add some DFT features on chip to test 3rd order delta sigma adc/dac in codec application. The ATE we use is not mixed signal ATE, it is digital; which makes me rely on the DFT/BIST added to thoroughly test the ADC/DAC. My understanding is that, Digital portion of the ADC and DAC are tested by standard digital dft techniques (scan/bist). What are the ways to test analog portion on chip? I see an issue in generation of analog stimuli on chip? Also, what are the necessary and sufficient adc/dac parameters that needs to be measured (on chip) to qualify the production test? |
The Designer's Guide Community Forum » Powered by YaBB 2.2.2! YaBB © 2000-2008. All Rights Reserved. |