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https://designers-guide.org/forum/YaBB.pl Modeling >> Semiconductor Devices >> About the channel legth modulation https://designers-guide.org/forum/YaBB.pl?num=1200383702 Message started by Richardyi on Jan 14th, 2008, 11:55pm |
Title: About the channel legth modulation Post by Richardyi on Jan 14th, 2008, 11:55pm Why the factor of channel legth modulation is different for nmos and pmos? Even for the channel length. Can anyone help me? Thanks. |
Title: Re: About the channel legth modulation Post by sheldon on Feb 8th, 2008, 2:59am Richard, In older processes, the bulk substrate concentration is different for the n-channel and p-channel transistors. Usually one device is built into well, while the other exists in the substrate. The well doping needs to "counter-dope" the substrate doping and is typically ~10x higher in concentration. As a result, the depletion regions change at different rates with applied bias for n-channel and p-channel transistors. The difference in the rate of change of the Drain-Bulk depletion region is a significant contributor to the difference in the channel length modulation. Best Regards, Sheldon |
Title: Re: About the channel legth modulation Post by Berti on Feb 8th, 2008, 3:34am Hi Sheldon, Quote:
Is it diffierent for advanced processes? |
Title: Re: About the channel legth modulation Post by sheldon on Feb 10th, 2008, 8:55am Berti, It should be a reasonable first-order approximation. Best Regards, Sheldon |
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