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https://designers-guide.org/forum/YaBB.pl Modeling >> Semiconductor Devices >> Strained Silicon https://designers-guide.org/forum/YaBB.pl?num=1220119934 Message started by nano_RF on Aug 30th, 2008, 11:12am |
Title: Strained Silicon Post by nano_RF on Aug 30th, 2008, 11:12am Hi All, I am not sure if this is the right forum to post this. But nonetheless curious to know about following. Lets assume that by process manipulation one has got a strained silicon device:- (1) What could be the possible effect on devices deep-depletion breakdown? If it gets lower then why and vice-versa? (2) This would be process dependent, but in general would one expect parasitics capacitance to increase? Thanks in Advance, |
Title: Re: Strained Silicon Post by Berti on Sep 30th, 2008, 7:40am Hi, The following paper probably answers your question: C. Claeys et al., "Impact strain engineering on gate stack quality and reliability", Solid-State Electronics (Pergamon Press), August 2008. Regards |
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