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Modeling >> Semiconductor Devices >> Bulk and Interface Traps
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Message started by littlenasboy on Jan 8th, 2009, 12:25pm

Title: Bulk and Interface Traps
Post by littlenasboy on Jan 8th, 2009, 12:25pm

How does one model the effect of bulk and interface traps on the DCIV characteristics of a MOS device?



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