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Design >> Analog Design >> Mismatch Parameter in Deep Submicron or nanometer technologies
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Message started by ic_engr on May 26^th, 2009, 9:19am

Title: Mismatch Parameter in Deep Submicron or nanometer technologies
Post by ic_engr on May 26^th, 2009, 9:19am

Hello All,

I heard there is a parameter which gives a feel for mismatches in a given CMOS technology. I believe its referred to as:

"Palgrim Constant."

Where would I find this and whats the symbol in Models for this ?

Any suggestions ?.

Regards

ic_engr

Title: Re: Mismatch Parameter in Deep Submicron or nanometer technologies
Post by wave on May 26^th, 2009, 12:51pm

ic_engr wrote on May 26^th, 2009, 9:19am:

Pelgrom is the author you want to lookup. If you are lucky, the process you are using is characterized with a constant relative to his eqn.

8-)