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Design >> Analog Design >> statistical mismatch model for umc 180 nm process
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Message started by indra0804 on Nov 29^th, 2013, 11:10pm

Title: statistical mismatch model for umc 180 nm process
Post by indra0804 on Nov 29^th, 2013, 11:10pm

Hi,

Can anyone share with me mismatch models for umc 180nm mixed mode, regular vt process. Or, at least if anyone could tell where or how to generate or find (in case it is already included in the umc package), that would be of great help.

In this regard, I would like to mention that I am trying to run a Monte Carlo sampling, to make some analysis for Capacitor Mismatch and I am getting an error like "ADEXL-5052--- Monte Carlo sampling stopped because no statistical data generated for the test----xxxx". I guess, this is because some statistical model file that I need to include. But, I dont know how to include that file and where to get that too. Please help....

Thanks & Regards,

Indrajit

Title: Re: statistical mismatch model for umc 180 nm process
Post by analog_rf on Nov 30^th, 2013, 3:18am

check your pdk from umc, they should have files for mismatch included already in them.

Title: Re: statistical mismatch model for umc 180 nm process
Post by indra0804 on Dec 12^th, 2013, 2:54am

Ok thanx