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Measurements >> Other Measurements >> ADC Offset and Gain Error Measurement
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Message started by John Galt on Dec 20th, 2005, 6:30am

Title: ADC Offset and Gain Error Measurement
Post by John Galt on Dec 20th, 2005, 6:30am

Hello all,
Is it possible to measure the gain and offset errors of an ADC by Sinewave Histogram Tests? If yes, could anyone please post some references. If not, then is there any other method for measurement of offset/gain errors?


Thanks.

Title: Re: ADC Offset and Gain Error Measurement
Post by pancho_hideboo on Dec 21st, 2005, 8:22am

Do you mean 2channel ADC ?
Generally "Gain Error" and "Offset Error" are characteristics of 2channel ADC, e.g. for I/Q ADC.
If so, why don't you use high speed word buffer for capturing ADC output code, then analyze by computer ?

Is there any merit in using Sinusoidal Histogram method for Gain and Offset ?

Sinusoidal Histogram method is suitable for evaluation of missing code and dynamic DNL.

???

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