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Measurements >> Other Measurements >> Noise characterization of transistors
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Message started by vivkr on May 7^th, 2007, 5:18am

Title: Noise characterization of transistors
Post by vivkr on May 7^th, 2007, 5:18am

Hi,

Is there an easy method of measuring/extracting the noise of a single device, or a small circuit built with a single transistor, and
maybe resistors?

The typical problem is that noise is so small that one needs an elaborate amplifier which adds very little noise of its own, and this
becomes a big design challenge. Also, the bandwidth of any amplifier used to boost up the noise of the DUT will then limit the
ability to measure white noise of the DUT at high frequencies.

Typically, the parameters of interest in any noise measurement are the noise and gM of the device, so that one may correlate the
observed noise vs. Gm and get a good idea of the way the real device noise correlates with the ideal expected noise (after noise
from all other sources is somehow removed).

Any comments will be appreciated.

Thanks
Vivek