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Design >> High-Power Design >> impact on current with change in metal thickness?
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Message started by sirous black on Apr 25th, 2008, 5:31am

Title: impact on current with change in metal thickness?
Post by sirous black on Apr 25th, 2008, 5:31am

On changing a given metal from 2XTM to 1XTM, what is the impact on current? I understand that there is a change in resistance, and hence overall IR drop, but current benig a surface phenomena wouldnt be affected.

Correct me if my assumption is wrong.




Title: Re: impact on current with change in metal thickne
Post by loose-electron on May 14th, 2008, 4:10pm

please explain with more detail what you are looking for

Title: Re: impact on current with change in metal thickne
Post by CMOSSolutions on May 29th, 2008, 9:25am

Is this a large mixed signal SOC? For large designs the IR drop in power distribution is pretty much DC to daylight, so thinner metal will affect the IR drop. Also check the current density and EM limits for your specific process. Hints about the type of design, frequency and process info would help.

Title: Re: impact on current with change in metal thickness?
Post by Maks on Apr 25th, 2010, 12:26pm


sirous black wrote on Apr 25th, 2008, 5:31am:
On changing a given metal from 2XTM to 1XTM, what is the impact on current? I understand that there is a change in resistance, and hence overall IR drop, but current benig a surface phenomena wouldnt be affected.

Correct me if my assumption is wrong.


Depending on the design of the power FET (metal resistivities, device resistance, layout shapes, metal strapping, etc.) changing metal thickness or resistance may or may not affect the total resistance and the pattern of the current flow. One needs to run simulations of the device + metals+ vias + wirebonds to understand the impact of an individual metal layer resistivity on the total Rdson value. See attached plot for an example of such simulations - the plot shows the current density distribution in the top metal layer of a three-metal-layer power MOSEFT design.

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