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Measurements >> Phase Noise and Jitter Measurements >> measuring Jee, Jcc, Jper
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Message started by casual on Aug 3rd, 2010, 9:12pm

Title: measuring Jee, Jcc, Jper
Post by casual on Aug 3rd, 2010, 9:12pm

Referring to designers-guide document, the 3 main types of jitter are edge2edge jitter Jee, Period jitter Jper and cycle2cycle jitter Jcc.

1)
When we plot eye-diagram of a clock and find the histogram across its threshold voltage of the clk, then the jitter we obtain is the edge2edge jitter Jee.
Jee is a high freq jitter.

2)
Cycle2cycle jitter Jcc can be obtained by:  delta of 1/(clkfreq_continuous)

(1 / (freq (VT("/clk") - VT("/clkb")) "rising" ?mode "user" ?threshold 0 ?xName "time" ?histoDisplay nil ?noOfHistoBins 1))

3)
Jper (accumulated jitter, long term jitter) can be obtained by post-processing -->accumulated_clk_period - accumulated_idealclk_period

note: The values above are not RMS but absolute values

Am I correct?

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