Hi all,

I am using ATN NP5 system for the RF transistor noise measurement. I observed that for the advanced technology of 0.18um and below for small and middle size devices (typically less than 100um total width), their NFmin measurement is very unstable even after open and short de-embedding. may i know what is the reason?

In the ATN NP5 software, there is a polynomial and weight setting for the noise parameter extraction. May i know how to set this polynomial and weight setting?

Thanks.

regds,
humble_student