Geoffrey_Coram
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I haven't worked with the Statistics block myself, but: surely the 'l' and 'w' are specific to some model card, that is, the variations you define for MOS are not the same ones used for MIM capacitors, since the variations are due to different processing steps.
So, it would seem there is some association of the statistics block with the model card of the device being simulated, and if you don't have a statistics block associated with your SPAD, then there will be no MC variation applied to it.
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