avlsi
Community Member
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Posts: 91
singapore
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Thanks, Ken,
I've created a draft of the test bench (TB) in line with the method you proposed. Here's a breakdown of the test cases:
Test Case 1: Applying 1 V to _avdd_ac for VDD rejection measurement. Test Case 2: Setting 1 V at _avss_ac to evaluate VSS rejection. Test Case 3: Using 1 V for _vref_ac to measure closed-loop gain, AC analysis bandwidth, and output noise. Test Case 4: Conducting STB analysis to determine loop gain, phase, and OTA UGBW. Test Case 5: Sweeping _vref_dc to measure the input and output common mode ranges. Test Case 6: Implementing a pulse on _vref_dc for settling time measurement. Test Case 7: Exploring whether setting _iout_ac and plotting Vout versus Frequency suffices for effective output impedance calculation.
To streamline the process, some of these test cases can be combined. For instance, combining Test Cases 1, 4, 5, and 6 into a single test could be more efficient.
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