Hi all,


I have an active balun which I want to characterize using on-wafer probing. Unfortunately, i'm not sure how I would go about calibrating the system for NF/conversion gain measurement. Does anybody have any good ideas? Keep in mind that the system needs to have single ended input and differential outputs.

I can see 2 possibilities.

1)  calibrate the system in GSG_in GSG_out configuration. The actual output is GSSG with an off chip balun (to combine the signals). Measure the NF. I would then have to live with the inaccuracy of the measurement.

2)  Calibrate the system in GSG_in GSG_out configuration. Terminate one of the output ports (either plus or minus) in 50 ohms. Measure the NF from GSG_in to the other output port. Correct the measurement (due to noise correlation/lack of).

Which one is better, or are there any other ways?


thanks,
Aaron

Thanks. That sounds more reasonable.