aaron_do
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Hi Lex,
It is a general question because I am looking for a reference with a general discussion - nothing too deep, but preferably with some numbers. Its not like I'm asking "what is a MOSFET used for?"...
Anyway since nobody seems to know any good ones, I'm interested in discussions on the following mechanisms: punch-through, hot carrier degradation, drain-bulk breakdown, and gate oxide breakdown. I'm not really interested in papers which go too deeply into the statistical analysis, more just a general discussion with some rules of thumb.
regards, Aaron
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