Peter,

Here is how you would access noise results from a spectreMDL run.  I realize that the documentation is a bit
lacking in this area and will be approved shortly.  If you are using MMSIM6.0.2 or later these are available
to you.

In summary there are 4 computed parameters that you can access after a noise analysis is run:
1.  Input noise    (in)
2. Output noise   (out)
3. Noise Factor    (F)
4. Noise Figure    (NF)

These parameters may be accessed using the following syntax:
<analysis_name>:<noise_parameter_name>

So for your particular case you would construct something similar to the following:

alias measurement my_noise_measure {
      export real input_noise, output_noise, noise_factor, noise_figure
      run noise (iprobe=id1, oprobe=vt1, param=freq, start=1, stop=100, log=3);
      input_noise = noise:in;
      output_noise = noise:out;
      noise_factor = noise:F;
      noise_figure = noise:NF;
}

run my_noise_measure;


Also your observation that the pss and pxf analyses could be run by MDL is indeed correct.  There is
no restriction on running the analyses themselves.  However, they are not integrated with the analyses, so
you cannot expect to be able to do measurements on their data.  For instance, you can run a pss analysis
from an MDL control file, but you would not be able to obtain max(V(node1)) for the pss solution, as the MDL
measurements are ONLY performed for the following analyses:
transient
ac
noise
dc ( and dcsweep )

Thanks,
-scott F.

Spectre does not provide the total output noise split into flicker, thermal etc components. It does however allow you to find the contribution of each noise source from each device - so you could find the amount of flicker noise contributed by each individual component instead.

Unfortunately Scott passed away in an accident in the middle of 2008. A great loss.

Regards,

Andrew.