Hi everyone,
DFT enables to identify the exact failure location in logic circuit. Just want to know if there exist similar concept for Analog/RF circuits.
If chip doesn't work on fabrication, how does one debug which block of it not working? May be one can have pads for direct-probing at i/p & o/p of each block. But then need to isolate the preceding & following stages. What are the built-in self testing techniques for Analog/RF.
Comments welcomed....Resources for detail reading appreciated