vivkr
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Hello,
Is there any reason to expect that channel thermal noise might be generated beyond transistor fT?
What is the limit of frequency that one might reasonably expect to see noise contributions at, and are these adequately captured in BSIM models? I seem to be getting noise contributions from channel current well beyond (an order of magnitude) the device fT and I think this doesn't make a lot of sense.
Thanks, Vivek
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