The Designer's Guide Community
Forum
Welcome, Guest. Please Login or Register. Please follow the Forum guidelines.
May 17th, 2024, 11:43am
Pages: 1
Send Topic Print
help with characterization of thin film semiconductor devices (Read 1834 times)
bhavi
New Member
*
Offline



Posts: 1

help with characterization of thin film semiconductor devices
Mar 19th, 2009, 10:14pm
 
Hi all,
I am currently working on some Barium Strontium Titanate and Aluminum Oxide thin films having n-Silicon substrate as the substrate. I have done a voltage sweep from +20V to -20V on the devices with the frequency constant for each sweep. The frequencies that I used are 1 kHz, 1 MHz and 10 MHz. Can anyone tell me how to find out the behavior of the devices in general from the values obtained from the voltage sweep.

Thanks in Advance.
Bhavi
Back to top
 
View Profile   IP Logged
Pages: 1
Send Topic Print
Copyright 2002-2024 Designer’s Guide Consulting, Inc. Designer’s Guide® is a registered trademark of Designer’s Guide Consulting, Inc. All rights reserved. Send comments or questions to editor@designers-guide.org. Consider submitting a paper or model.